Versailles Project on Advanced Materials and Standards (VAMAS)

VAMAS supports world trade in products dependent on advanced materials technologies, through International collaborative projects aimed at providing the technical basis for harmonized measurements, testing, specifications, and standards.

 

Call for Participation

Development of guidelines for reproducible TEM specimen preparation by focused ion beam processing
Measurement of lateral resolution of Raman Microscopy with nanowire artefacts
Line notation and unique identifiers for nanomaterials and groups of nanomaterials
Validating biosensor binding kinetics for microorganism antigens  
Quantification of an SI-traceable reference material in cells post-transfection 
Chemical composition of functionalized graphene with X-ray photoelectron spectroscopy (XPS)
Number of layers of a CVD grown graphene sheet using Transmission Electron Microscopy (TEM) and Selected Area Electron Diffraction (SAED)
Determination of the S, F, Cl and Br content of graphene powders by Combustion Ion Chromatography (C-IC)
Determination of disorder and number of layers of graphene flakes by Raman Spectroscopy
Lateral size and thickness measurement of few-layer graphene flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM)
Measurement of spatial homogeneity in two-dimensional semiconductors

 

VAMAS Publication

Guideline for the Design and Operation of Interlaboratory Comparisons - Gert Roebben, (Report No 50), 2017

To obtain a free electronic copy, please email info@vamas.org