Versailles Project on Advanced Materials and Standards (VAMAS)

VAMAS supports world trade in products dependent on advanced materials technologies, through International collaborative projects aimed at providing the technical basis for harmonized measurements, testing, specifications, and standards.

 

Call for Participation

	Development of guidelines for reproducible TEM specimen preparation by focused ion beam processing
	Measurement of lateral resolution of Raman Microscopy with nanowire artefacts
	Line notation and unique identifiers for nanomaterials and groups of nanomaterials
	Validating biosensor binding kinetics for microorganism antigens
	Quantification of an SI-traceable reference material in cells post-transfection
	Chemical composition of functionalized graphene with X-ray photoelectron spectroscopy (XPS)
	Number of layers of a CVD grown graphene sheet using Transmission Electron Microscopy (TEM) and Selected Area Electron Diffraction (SAED)
	Determination of the S, F, Cl and Br content of graphene powders by Combustion Ion Chromatography (C-IC)
	Determination of disorder and number of layers of graphene flakes by Raman Spectroscopy
	Lateral size and thickness measurement of few-layer graphene flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM)
	Measurement of spatial homogeneity in two-dimensional semiconductors

 

VAMAS Publication Guideline for the Design and Operation of Interlaboratory Comparisons - Gert Roebben, (Report No 50), 2017 To obtain a free electronic copy, please email info@vamas.org