TWA 37
Quantitative Microstructural Analysis
The objective of this TWA is to develop harmonised test procedures for quantitative microstructural analysis using microbeam instruments such as a transmission electron microscope, scanning electron microscope and electronprobe microanalyser.
Activities will include interlaboratory comparison studies of measurement methods and pre-normative research required for the development of robust international standards. The main output for the work will be to support the work of ISO TC 202 on Microbeam Analysis.
Completed Projects
PROJECT 2 : Investigation of sharpness of scanning electron microscope (SEM) images
Active Projects
PROJECT 3: Development of guidelines for reproducible TEM specimen preparation by focused ion beam processing
PROJECT 4:Measurement of dislocation density in metallic materials by Transmission Electron Microscope (TEM)
PROJECT 7:Evaluation method of surface layer quality of TEM specimen prepared by focused ion beam processing
More information
Dr. Dan Hodoroaba (dan.hodoroaba@bam.de) +49 30 8104 3144
