TWA 37
Quantitative Microstructural Analysis

The objective of this TWA is to develop harmonised test procedures for quantitative microstructural analysis using microbeam instruments such as a transmission electron microscope, scanning electron microscope and electronprobe microanalyser.
Activities will include interlaboratory comparison studies of measurement methods and pre-normative research required for the development of robust international standards. The main output for the work will be to support the work of ISO TC 202 on Microbeam Analysis.
PROJECT 2 : Investigation of sharpness of scanning electron microscope (SEM) images
PROJECT 3: Development of guidelines for reproducible TEM specimen preparation by focused ion beam processing
PROJECT 4:Measurement of dislocation density in metallic materials by Transmission Electron Microscope (TEM)
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Dr. Dan Hodoroaba (dan.hodoroaba@bam.de) +49 30 8104 3144