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TWA 37

Quantitative Microstructural Analysis

Cr distribution in a corroded steel sample

The objective of this TWA is to develop harmonised test procedures for quantitative microstructural analysis using microbeam instruments such as a transmission electron microscope, scanning electron microscope and electronprobe microanalyser.

Activities will include interlaboratory comparison studies of measurement methods and pre-normative research required for the development of robust international standards. The main output for the work will be to support the work of ISO TC 202 on Microbeam Analysis.

Completed Projects

PROJECT 1 :Determination of reproducibility and repeatability of grain size measurement by Electron Back Scattered Diffraction (EBSD)

PROJECT 2 : Investigation of sharpness of scanning electron microscope (SEM) images

Active Projects

PROJECT 3: Development of guidelines for reproducible TEM specimen preparation by focused ion beam processing

PROJECT 4:Measurement of dislocation density in metallic materials by Transmission Electron Microscope (TEM)

PROJECT 5:Repeatability of high angular resolution electron backscatter diffraction (HR-EBSD) analysis for elastic strain measurements

PROJECT 6:Mesurement of grain size and distribution of nano-scale metal using Transmission Kikuchi Diffraction technique in SEM

PROJECT 7:Evaluation method of surface layer quality of TEM specimen prepared by focused ion beam processing

PROJECT 8:Guidelines on FIB Preparation of Atom Probe Tomography (APT) Specimens

PROJECT 9:Cross-section preparation of inorganic pigments: enabling sizing, shape and microstructure analysis (joint project with TWA 34-20)

PROJECT 10:A method to evaluate ion-beam alignment for FIB-SEM

More information

Dr. Dan Hodoroaba (dan.hodoroaba@bam.de) +49 30 8104 3144