Home >Technical Working Areas > Projects and Interlaboratory
Comparisons
Projects and Interlaboratory Comparisons
If you wish to participate, please contact the
Technical Work Area Chairs directly or contact the
VAMAS Secretariat.
TWA 2 - Surface Chemical Analysis
A12 |
International round robin t for graphene layer number characterization by Kelvin Probe Force Microscopy |
A15 |
International round robin test for reproducible restoration methodology for AFM topography images using probe shape function |
A20 | Inter-laboratory study of work function measurement by photoelectron spectrometer |
A21 | Effects of Temperature and Humidity on Dimensional AFM Nanoscale Measurements |
A22 | Applying planar, patterned, multi-metallic samples to assess the impact of analysis area in surface-chemical analysis |
A23 | Determination of the minimum detectability of surface plasmon resonance device |
A24 | Guidelines for shape and size analysis of nano-particles by atomic force microscopy |
A25 | Interlaboratory study on atom probe quantification and reproducibility |
TWA 5 - Polymer Composites
TWA 16 - Superconducting Materials
WG1-2 | Measurement method of critical temperature in oxide
superconductors |
WG1-4 |
AC loss measurement in YBCO coated conductors |
WG3-1 |
Measurement methods of surface resistance in thin film
superconductors |
TWA 22 - Mechanical Property Measurement
for Thin Films and Coatings
7 |
Intercomparison of Modulus and viscosity measurement of polymers |
8 | Incremental FIB micro-milling for intrinsic stress evaluation at the sub-micron scale |
6 |
Measurement of thermophysical and thermomechanical properties by Scanning Thermal Microscopy (SThM) |
TWA 24 - Performance Related Properties of
Electroceramics
TWA 29 - Nanomechanics Applied to Scanning Probe Microscopy
1B |
Cantilever spring constant calibration round robin |
TWA 31 - Creep/Fatigue Crack Growth in Weldments
TWA 32 - Modulus Measurements
TWA 33 - Polymer Nanocomposites
TWA 34 - Nanoparticle Populations
TWA 36 - Printed, flexible and stretchable electronics
3 |
Sheet resistance measurements of inhomogeneous electrodes |
TWA 37 - Quantitative Microstructural Characterization
1 |
Determination of reproducibility and repeatability of grain size measurement by Electron Back Scattered Diffraction (EBSD) |
2 | Investigation of sharpness of scanning electron microscope (SEM) images and input to proposed ISO standard |
TWA 38 - Thermoelectric Materials
1 |
Measurements of the Seebeck coefficient |
TWA 39 - Solid Sorbents
TWA 40 - Synthetic Biomaterials
TWA 41 - Graphene and Related 2D Materials
TWA 42 - Raman Spectroscopy and Microscopy